首页> 外文OA文献 >Measurements of wavelength-dependent double photoelectron emission from single photons in VUV-sensitive photomultiplier tubes
【2h】

Measurements of wavelength-dependent double photoelectron emission from single photons in VUV-sensitive photomultiplier tubes

机译:波长相关的双光电子发射的测量   VUV敏感光电倍增管中的单光子

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

Measurements of double photoelectron emission (DPE) probabilities as afunction of wavelength are reported for Hamamatsu R8778, R8520, and R11410VUV-sensitive photomultiplier tubes (PMTs). In DPE, a single photon strikes thePMT photocathode and produces two photoelectrons instead of a single one. Itwas found that the fraction of detected photons that result in DPE emission isa function of the incident photon wavelength, and manifests itself below$\sim$250 nm. For the xenon scintillation wavelength of 175 nm, a DPEprobability of 18--24\% was measured depending on the tube and measurementmethod. This wavelength-dependent single photon response has implications forthe energy calibration and photon counting of current and future liquid xenondetectors such as LUX, LZ, XENON100/1T, Panda-X and XMASS.
机译:报导了滨松R8778,R8520和R11410VUV敏感光电倍增管(PMT)的双光电子发射(DPE)概率随波长的变化。在DPE中,单个光子撞击PMT光电阴极并产生两个光电子,而不是一个。已经发现,导致DPE发射的检测到的光子的分数是入射光子波长的函数,并且表现出低于250nm。对于氙闪烁波长175 nm,根据管和测量方法测得的DPE概率为18--24%。这种与波长有关的单光子响应对当前和将来的液态氙探测器(例如LUX,LZ,XENON100 / 1T,Panda-X和XMASS)的能量校准和光子计数有影响。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号